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Characterization

Home / Facility / Characterization

Characterization

Chamber probe station
Chamber probe station
semiconductor-analyzer
Semiconductor parameter analyzer
lcr-meter-impedance-analyzer
LCR meter
oscilloscope
Oscilloscope
visible-laser
Laser with visible light
afm
AFM
hr-xrd
HRXRD
mask-aligner
Mask aligner for device patterning
om
Optical Microscope
powder-xrd
Powder XRD
ppms
PPMS
spin-coater
Spin Coater
wire-bonder
Wire Bonder
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